- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 15/08 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring roughness or irregularity of surfaces
Patent holdings for IPC class G01B 15/08
Total number of patents in this class: 48
10-year publication summary
|
2
|
2
|
2
|
2
|
7
|
8
|
1
|
6
|
1
|
1
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 4424 |
5 |
| Hitachi High-Technologies Corporation | 2034 |
4 |
| ASML Netherlands B.V. | 6816 |
3 |
| Applied Materials Israel, Ltd. | 549 |
2 |
| Hexagon Metrology, Inc. | 149 |
2 |
| KLA-Tencor Corporation | 2574 |
2 |
| Nireco Corporation | 52 |
2 |
| Fujitsu Limited | 19265 |
1 |
| Denso Corporation | 23338 |
1 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
1 |
| Mitsubishi Electric Corporation | 43934 |
1 |
| Blue Leaf I.P., Inc. | 2758 |
1 |
| Tsinghua University | 5426 |
1 |
| Mitsubishi Chemical Corporation | 4313 |
1 |
| Beamsense Co., Ltd. | 11 |
1 |
| Building Materials Investment Corporation | 158 |
1 |
| Dalian University of Technology | 1387 |
1 |
| EOS GmbH Electro Optical Systems | 398 |
1 |
| FARO Technologies, Inc. | 786 |
1 |
| JFE Steel Corporation | 6067 |
1 |
| Other owners | 15 |